Aberration corrected Lorentz scanning transmission electron microscopy
نویسندگان
چکیده
منابع مشابه
Aberration-corrected scanning transmission electron microscopy of semiconductors
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ژورنال
عنوان ژورنال: Ultramicroscopy
سال: 2015
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2015.01.003